SSIM
About SSIM Labs
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EMIT Lab
Raman Lab
Characterization Lab
The Characterization Lab is where an atomic force microscope (AFM), nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) machines and other technologies enable materials to be understood and exploited at atomic scales.
Microfabrication Lab
Class 100 Cleanroom and BSL (BioSafety Level) 2 Lab
Design Lab
Contact Us
Smart Sensors and Integrated Microsystems (SSIM) Program
Wayne State University
College of Engineering Room 3172
5050 Anthony Wayne Drive
Detroit, MI 48202
Ph: 313-577-1306
Fax: 313-577-1101